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RESISTIVE SWITCHING IN NITROGEN-DOPED MGO

机译:掺氮MGO的电阻切换

摘要

pNitrogen-doped MgO insulating layers exhibit voltage controlled resistance states, e.g., a high resistance and a low resistance state. Patterned nano-devices on the 100 nm scale show highly reproducible switching characteristics. The voltage levels at which such devices are switched between the two resistance levels can be systematically lowered by increasing the nitrogen concentration. Similarly, the resistance of the high resistance state can be varied by varying the nitrogen concentration, and decreases by orders of magnitude by varying the nitrogen concentrations by a few percent. On the other hand, the resistance of the low resistance state is nearly insensitive to the nitrogen doping level. The resistance of single Mg50O50-xNx layer devices can be varied over a wide range by limiting the current that can be passed during the SET process. Associated data storage devices can be constructed./p[US2011140762A1]
机译:氮掺杂的MgO绝缘层表现出电压控制的电阻状态,例如高电阻和低电阻状态。 100 nm规模的图案化纳米器件显示出高度可复制的开关特性。可以通过增加氮浓度来系统地降低在两个电阻值之间切换此类设备的电压值。类似地,可以通过改变氮浓度来改变高阻态的电阻,并且通过将氮浓度改变百分之几来降低高数量级的电阻。另一方面,低电阻状态的电阻对氮掺杂水平几乎不敏感。通过限制SET过程中可以通过的电流,单个Mg50O50-xNx层器件的电阻可以在很宽的范围内变化。可以构造关联的数据存储设备。 [US2011140762A1]

著录项

  • 公开/公告号IN289912B

    专利类型

  • 公开/公告日2017-12-01

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN4151/CHENP/2012

  • 发明设计人

    申请日2010-09-21

  • 分类号

  • 国家 IN

  • 入库时间 2022-08-21 12:51:38

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