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PROJECTION EXPOSURE SYSTEM AND METHOD FOR REDUCING DEFORMATIONS OF COMPONENTS OF THE PROJECTION EXPOSURE SYSTEM CAUSED BY DYNAMIC ACCELERATIONS
PROJECTION EXPOSURE SYSTEM AND METHOD FOR REDUCING DEFORMATIONS OF COMPONENTS OF THE PROJECTION EXPOSURE SYSTEM CAUSED BY DYNAMIC ACCELERATIONS
The invention relates to a projection exposure system (1) for semiconductor lithography, comprising at least one component (22) and a support device having at least one support actuator (23) which acts on at least one support point (27) of the component (22) in such a way that deformations of the component (22) are reduced, wherein the support device has a control unit (28) for actuating the at least one support actuator (23), wherein the control unit (28) is configured to actuate the support actuator (23) during a dynamic acceleration acting on the component (22). The invention also relates to a method for reducing deformations of components of a projection exposure system for semiconductor lithography caused by dynamic accelerations.
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