首页> 外国专利> Laser annealing method, laser annealing apparatus and manufacturing method of thin film transistor

Laser annealing method, laser annealing apparatus and manufacturing method of thin film transistor

机译:激光退火方法,激光退火装置及薄膜晶体管的制造方法

摘要

The present invention relates to a laser annealing method for forming an amorphous silicon thin film (7) deposited on a substrate (5) by irradiating laser light (L) onto the amorphous silicon thin film (7) The irradiation area is changed and multiple irradiation is performed to form a particle diameter distribution in which the diameter of the polysilicon crystal grain decreases from the center toward the front end along the center line C of the irradiation area of the laser light L at least. This makes it possible to realize a laser annealing method capable of reducing the leakage current by a simple process.
机译:本发明涉及一种激光退火方法,其通过将激光(L)照射到非晶硅薄膜(7)上来形成沉积在基板(5)上的非晶硅薄膜(7)。进行这样的处理以形成粒径分布,其中,多晶硅晶粒的直径至少沿着激光L的照射区域的中心线C从中心朝着前端减小。这使得可以实现能够通过简单的工艺减小泄漏电流的激光退火方法。

著录项

  • 公开/公告号KR20180010184A

    专利类型

  • 公开/公告日2018-01-30

    原文格式PDF

  • 申请/专利权人 브이 테크놀로지 씨오. 엘티디;

    申请/专利号KR20177033062

  • 发明设计人 미주무라 미치노부;

    申请日2016-05-13

  • 分类号H01L21/324;H01L21/268;H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 12:41:02

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号