首页> 外国专利> Nonvolatile, isolated gate memory cells having integrated high-K metal gate logic devices and metal-free erase gates, and methods of making same

Nonvolatile, isolated gate memory cells having integrated high-K metal gate logic devices and metal-free erase gates, and methods of making same

机译:具有集成的高K金属栅极逻辑器件和无金属擦除栅极的非易失性隔离栅极存储器单元及其制造方法

摘要

A method of forming isolated gate nonvolatile memory cells on the same chip as logic and high voltage devices with HKMG logic gates is disclosed. The method includes forming a poly layer for source and drain regions, floating gates, control gates, and erase gates and word line gates in a memory region of the chip. A protective insulating layer is formed over the memory region, a HKMG layer and a poly layer are formed on the chip, removed from the memory region, and patterned in the logic regions of the chip to form logic gates with a variable amount of bottom insulation .
机译:公开了一种在与具有HKMG逻辑门的逻辑和高压器件相同的芯片上形成隔离栅非易失性存储单元的方法。该方法包括在芯片的存储区域中形成用于源极和漏极区域,浮置栅极,控制栅极以及擦除栅极和字线栅极的多晶硅层。在存储器区域上方形成保护绝缘层,在芯片上形成HKMG层和多晶硅层,将其从存储器区域移除,并在芯片的逻辑区域中进行构图,以形成具有可变底部绝缘量的逻辑门。

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