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- MEMS SEMICONDUCTOR DEVICE AND SIGMA-DELTA LOOP MEMS ACQUISITION

机译:-MEMS半导体器件和SIGMA-DELTA LOOP MEMS收购

摘要

Semiconductor device measures the condition of the MEMS as a first voltage change in the sense node. State of the MEMS is comprises a capacitance. A first capacitor is connected between the input of the sense node and the integrator to transmit the first voltage change as a first signal to the second node. The second voltage change as a second signal is routed to the second node via the second capacitor. The integrator to integrate the first and second signals and provides the integrated signal. The ADC has an input coupled to the output of the integrator and converts the integrated signal to a digital signal representative of the capacitance of the MEMS. A DAC having an input coupled to the output of the ADC. The second capacitor is connected between the output and the sense node of the DAC.
机译:半导体器件将MEMS的状态作为传感节点中的第一电压变化进行测量。 MEMS的状态包括电容。第一电容器连接在感测节点的输入与积分器之间,以将第一电压变化作为第一信号传输至第二节点。作为第二信号的第二电压变化经由第二电容器被路由至第二节点。积分器积分第一和第二信号并提供积分信号。 ADC具有耦合至积分器的输出的输入,并将积分信号转换为表示MEMS电容的数字信号。一种DAC,其输入耦合到ADC的输出。第二个电容器连接在DAC的输出和检测节点之间。

著录项

  • 公开/公告号KR101839660B1

    专利类型

  • 公开/公告日2018-03-16

    原文格式PDF

  • 申请/专利权人 셈테크 코포레이션;

    申请/专利号KR20157024793

  • 发明设计人 나이 올리버;쉐브로 미쉘;

    申请日2014-03-11

  • 分类号G01D5/24;G01R27/26;G01R31/26;G01R31/28;G05B19/00;

  • 国家 KR

  • 入库时间 2022-08-21 12:38:11

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