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Apparatus and methods for wafer rotation to improve spatial ALD process uniformity

机译:用于晶圆旋转以改善空间ALD工艺均匀性的设备和方法

摘要

Apparatus and methods for rotating wafers during processing include a wafer rotation assembly with a support fixture connected to a shaft and a wafer transfer assembly with a robot blade with an opening therethrough, the opening sized to allow the support surface of the support fixture to pass through the opening. A first actuator is connected to the wafer rotation assembly to rotate the support fixture assembly about an axis of the shaft. A second actuator is connected to the wafer rotation assembly to move the support fixture assembly a stroke distance along the axis of the shaft. Process kits including the wafer rotation assemblies and robot blades with openings can used to retrofit existing mainframe processing chambers.
机译:用于在处理期间旋转晶片的设备和方法包括:晶片旋转组件,其具有连接至轴的支撑夹具;以及晶片传送组件,其具有机器人刀片,该机器人刀片具有穿过其的开口,该开口的尺寸设计成允许支撑夹具的支撑表面穿过。开幕式。第一致动器连接到晶片旋转组件,以使支撑夹具组件绕轴的轴线旋转。第二致动器连接至晶片旋转组件,以使支撑夹具组件沿轴的轴线移动行程距离。包括晶片旋转组件和带开口的机械手刀片在内的处理套件可用于改造现有的主机处理室。

著录项

  • 公开/公告号US10186449B2

    专利类型

  • 公开/公告日2019-01-22

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC.;

    申请/专利号US201715851096

  • 申请日2017-12-21

  • 分类号H01L21/687;H01L21/677;G06F9/30;B25J9/04;H01L21/67;

  • 国家 US

  • 入库时间 2022-08-21 12:11:23

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