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Method for making a semiconductor device including a resonant tunneling diode structure having a superlattice

机译:包括具有超晶格的谐振隧穿二极管结构的半导体器件的制造方法

摘要

A method for making a semiconductor device may include forming at least one double-barrier resonant tunneling diode (DBRTD) by forming a first doped semiconductor layer, and forming a first barrier layer on the first doped semiconductor layer and including a superlattice. The superlattice may include stacked groups of layers, each group of layers including stacked base semiconductor monolayers defining a base semiconductor portion, and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. The method may further include forming an intrinsic semiconductor layer on the first barrier layer, forming a second barrier layer on the intrinsic semiconductor layer, and forming a second doped semiconductor layer on the second superlattice layer.
机译:用于制造半导体器件的方法可以包括:通过形成第一掺杂半导体层来形成至少一个双势垒共振隧穿二极管(DBRTD);以及在第一掺杂半导体层上形成第一势垒层并且包括超晶格。超晶格可包括堆叠的层组,每组层包括限定基础半导体部分的堆叠的基础半导体单层,以及约束在相邻基础半导体部分的晶格内的至少一个非半导体单层。该方法可以进一步包括在第一阻挡层上形成本征半导体层,在本征半导体层上形成第二阻挡层,以及在第二超晶格层上形成第二掺杂半导体层。

著录项

  • 公开/公告号US10249745B2

    专利类型

  • 公开/公告日2019-04-02

    原文格式PDF

  • 申请/专利权人 ATOMERA INCORPORATED;

    申请/专利号US201715670240

  • 申请日2017-08-07

  • 分类号H01L29/737;H01L29/10;H01L29/36;H01L29/66;H01L29/78;H01L27/092;H01L29/15;H01L29/161;H01L29/861;H01L29/88;

  • 国家 US

  • 入库时间 2022-08-21 12:10:32

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