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Ellipsometry Device and Ellipsometry Method
Ellipsometry Device and Ellipsometry Method
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机译:椭偏仪和椭偏仪
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摘要
The present invention provides an ellipsometry device and an ellipsometry method whereby measurement efficiency can be enhanced. In this method, an object is illuminated by spherical-wave-like illumination light Q linearly polarized at 45° (S1), and an object light O, being a reflected light, is acquired in a hologram IOR using a spherical-wave-like reference light R having a condensing point near the condensing point of the illumination light Q, and a hologram ILR of the reference light R is furthermore acquired using a spherical-wave reference light L having the same condensing point as that of the illumination light Q (S2). The holograms are separated into p- and s-polarized light holograms IKOR, IKLR, κ=p, s and processed to extract object light waves, and object light spatial frequency spectra GK(u, v), κ=p, s are generated (S3) (S4). Ellipsometric angles ψ(θ), Δ(θ) are obtained for each incident angle θ from the amplitude reflection coefficient ratio ρ=Gp/Gs=tan ψ·exp(iΔ). Through use of numerous lights having different incident angles θ included in the illumination light Q, data of numerous reflection lights can be acquired collectively in a hologram and can be processed.
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机译:本发明提供一种椭偏测定装置和椭偏测定方法,可以提高测定效率。在该方法中,通过以45°线性偏振的球形波状照明光Q(S 1 B>)照明物体,并且在全息图中获取作为反射光的物体光O。 I OR Sub>使用会聚点靠近照明光Q的聚光点的球面状参考光R和参考光R的全息图I LR Sub>此外,使用具有与照明光Q(S 2 B>)相同的聚光点的球面参考光L来获取“λ”。全息图分为p和s偏振光全息图I K Sup> OR Sub>,I K Sup> LR Sub>,κ = p,s并进行处理以提取目标光波,并生成目标光空间频谱G K Sup>(u,v),κ= p,s(S 3 B> )(S 4 B>)。从振幅反射系数比ρ= G p Sup> / G s Sup> = tanψ·exp获得每个入射角θ的椭偏角ψ(θ),Δ(θ) (iΔ)。通过使用包括在照明光Q中的具有不同入射角θ的许多光,可以在全息图中集中地获取并可以处理大量反射光的数据。
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