SILICON SINGLE CRYSTAL PULLING CONDITION CALCULATION PROGRAM, SILICON SINGLE CRYSTAL HOT ZONE IMPROVEMENT METHOD, AND SILICON SINGLE CRYSTAL GROWING METHOD
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SILICON SINGLE CRYSTAL PULLING CONDITION CALCULATION PROGRAM, SILICON SINGLE CRYSTAL HOT ZONE IMPROVEMENT METHOD, AND SILICON SINGLE CRYSTAL GROWING METHOD
SILICON SINGLE CRYSTAL PULLING CONDITION CALCULATION PROGRAM, SILICON SINGLE CRYSTAL HOT ZONE IMPROVEMENT METHOD, AND SILICON SINGLE CRYSTAL GROWING METHOD
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机译:硅单晶拉拔条件计算程序,硅单晶热区改进方法和硅单晶生长方法
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摘要
A pulling condition calculation program enables a computer to perform the steps of: setting a plurality of sets of pulling conditions based on solid-liquid interface height and distance between a surface of a silicon melt and a heat shield plate; performing, for each set of the pulling conditions, the steps of: calculating a heat flux (q) (W/m2) and a crystal surface temperature (T); defining a reference temperature (Tref) given by an equation (1) below and a geometry of the solid-liquid interface as boundary conditions,recalculating an in-crystal temperature distribution; calculating a mean stress in the monocrystalline silicon; calculating a defect distribution in a pulling direction based on the mean stress and the in-crystal temperature distribution; determining a defect-free region in the pulling direction; and drawing a contour line showing a dimension of the defect-free region on a two-dimensional map defined by the distance and the solid-liquid interface height.; ]]>
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机译:拉拔条件计算程序使计算机能够执行以下步骤:基于固液界面高度和硅熔体的表面与隔热板之间的距离来设置多组拉拔条件;以及对于每组提拉条件,执行以下步骤:计算热通量(q)(W / m 2 Sup>)和晶体表面温度(T);定义下面的等式(1)给出的参考温度(Tref)和固-液界面的几何形状作为边界条件,重新计算晶体内温度分布;计算单晶硅中的平均应力;根据平均应力和晶体内温度分布,计算出拉拔方向的缺陷分布;确定在拉动方向上的无缺陷区域;画出轮廓线,该轮廓线在由距离和固液界面高度限定的二维图上示出无缺陷区域的尺寸。 展开▼