首页> 外国专利> SiC semiconductor devices is formed in insulation or semi-insulation SiC substrate and its manufacturing method

SiC semiconductor devices is formed in insulation or semi-insulation SiC substrate and its manufacturing method

机译:在绝缘或半绝缘SiC衬底中形成SiC半导体器件及其制造方法

摘要

The present invention relates to a SiC semiconductor device having a high withstand voltage characteristic, and a manufacturing method thereof. The SiC semiconductor device includes an insulation or semi-insulation SiC substrate; semiconductor regions which are formed on the SiC substrate; and electrodes which are formed on the SiC substrate and are electrically connected to doping regions. The SiC semiconductor device according to the present invention has a high concentration semiconductor region on the insulation or semi-insulation SiC substrate. Thereby, the high withstand voltage characteristic is obtained. The SiC semiconductor device can be realized by an ion implantation process.;COPYRIGHT KIPO 2016
机译:具有高耐压特性的SiC半导体器件及其制造方法技术领域本发明涉及具有高耐压特性的SiC半导体器件及其制造方法。 SiC半导体器件包括绝缘或半绝缘的SiC衬底;和在SiC衬底上形成的半导体区域;电极形成在SiC衬底上并电连接到掺杂区。根据本发明的SiC半导体器件在绝缘或半绝缘SiC衬底上具有高浓度半导体区域。由此,获得高耐压特性。可以通过离子注入工艺实现SiC半导体器件。; COPYRIGHT KIPO 2016

著录项

  • 公开/公告号KR101964153B1

    专利类型

  • 公开/公告日2019-04-03

    原文格式PDF

  • 申请/专利权人 한국전기연구원;

    申请/专利号KR20140113006

  • 发明设计人 문정현;김형우;김남균;방욱;

    申请日2014-08-28

  • 分类号H01L29/16;

  • 国家 KR

  • 入库时间 2022-08-21 11:48:50

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号