首页> 外国专利> Vertical trench DMOSFET having integrated implants forming enhancement diodes in parallel with the body diode

Vertical trench DMOSFET having integrated implants forming enhancement diodes in parallel with the body diode

机译:具有集成注入的垂直沟槽DMOSFET,该注入形成与体二极管并联的增强二极管

摘要

Fabricating a semiconductor device comprises: forming a gate trench in an epitaxial layer overlaying a semiconductor substrate; depositing gate material in the gate trench; forming a body in the epitaxial layer; forming a source embedded in the body; forming a contact trench that extends through the source and at least part of the body; disposing an implant at least along a contact trench wall; and disposing an epitaxial enhancement portion below the contact trench and in contact with the implant.
机译:制造半导体器件的步骤包括:在覆盖半导体衬底的外延层中形成栅极沟槽;在栅极沟槽中沉积栅极材料;在外延层中形成主体;形成嵌入体内的来源;形成接触沟槽,该接触沟槽延伸穿过源极和主体的至少一部分;至少沿着接触沟槽壁布置植入物;将外延增强部分设置在接触沟槽下方并与植入物接触。

著录项

  • 公开/公告号US10763351B2

    专利类型

  • 公开/公告日2020-09-01

    原文格式PDF

  • 申请/专利权人 ALPHA AND OMEGA SEMICONDUCTOR INCORPORATED;

    申请/专利号US201615061853

  • 发明设计人 JI PAN;ANUP BHALLA;

    申请日2016-03-04

  • 分类号H01L29/78;H01L29/08;H01L29/10;H01L29/423;H01L29/66;H01L29/861;H01L29/872;H01L21/265;H01L21/306;H01L29/417;H01L29/47;

  • 国家 US

  • 入库时间 2022-08-21 11:29:08

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