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Metal gate MOSFET terahertz detector based on periodically rasterized drain
Metal gate MOSFET terahertz detector based on periodically rasterized drain
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机译:基于周期性光栅化漏极的金属栅极MOSFET太赫兹检测器
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摘要
The present invention discloses a metal gate MOSFET terahertz detector based on a periodically rasterized drain, comprising a metal gate MOSFET having the periodically rasterized drain and various different pattern forms thereof, a low noise preamplifier and a voltage feedback loop, wherein the drain of the metal gate MOSFET is always used for receiving a terahertz signal, the gate of the metal gate MOSFET is connected to a first bias voltage source via a first bias resistor, a first DC blocking capacitor is connected between a source of the metal gate MOSFET and a positive input terminal of the low noise preamplifier, and the positive input terminal of the low noise preamplifier is connected to a second bias voltage source via a second bias resistor; and the voltage feedback loop comprises a feedback resistor, a grounding resistor, a second DC blocking capacitor, and a third DC blocking capacitor. The present invention realizes the adjustment of the THz response wave-band range by adjusting rasterized structure parameters of the drain, thereby improving the detection sensitivity of the detector and realizing a narrow band (even point frequency) of terahertz detection.
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