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SPLIT GATE FLASH MEMORY SYSTEM USING COMPLEMENTARY VOLTAGE SUPPLIES

机译:使用补充电压供应的分割门闪存存储系统

摘要

The nonvolatile memory device includes a semiconductor substrate of a first conductivity type. An array of nonvolatile memory cells is located in a semiconductor substrate and arranged in a plurality of rows and columns. Each memory cell includes a first region on the surface of the semiconductor substrate of the second conductivity type and a second region on the surface of the semiconductor substrate of the second conductivity type. The channel region is between the first region and the second region. The word line lies over and is insulated from the first portion of the channel region and is adjacent to the first region and little or no overlap with the first region. A floating gate overlies the second portion of the channel region, is adjacent to and insulated from the first portion, and adjacent to the second region. A coupling gate lies over the floating gate. The bit line is connected to the first region. During programming, reading, or erasing operations, a negative voltage may be applied to word lines and / or coupling gates of selected or unselected memory cells.
机译:非易失性存储器件包括第一导电类型的半导体衬底。非易失性存储单元的阵列位于半导体衬底中并且布置成多个行和列。每个存储单元包括在第二导电类型的半导体衬底的表面上的第一区域和在第二导电类型的半导体衬底的表面上的第二区域。沟道区域在第一区域和第二区域之间。字线位于沟道区的第一部分之上并且与沟道区的第一部分绝缘,并且与第一区域相邻并且与第一区域很少或没有重叠。浮栅覆盖在沟道区的第二部分上,与第一部分相邻并与其绝缘,并且与第二区域相邻。耦合栅极位于浮置栅极上方。位线连接到第一区域。在编程,读取或擦除操作期间,可将负电压施加到选定或未选定存储单元的字线和/或耦合栅极。

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