The present invention realizes an inspection apparatus capable of efficiently testing a device in a different environment without causing an excessively large size of the inspection apparatus and an excessively slowing down the inspection speed. The inspection apparatus includes a first index table, a second index table, and an arm for moving and mounting a device between the first index table and the second index table. The first index table is tested in a room temperature environment, and the second index table is tested in a high temperature environment.
展开▼
