首页> 外国专利> MOTHER SUBSTRATE FOR A DISPLAY SUBSTRATE ARRAY TESTING METHOD THEREOF AND DISPLAY SUBSTRATE

MOTHER SUBSTRATE FOR A DISPLAY SUBSTRATE ARRAY TESTING METHOD THEREOF AND DISPLAY SUBSTRATE

机译:用于显示基板阵列测试方法的母基板及其显示基板

摘要

The mother substrate for a display substrate includes a plurality of gate lines, a gate circuit portion for driving the gate lines, and a gate pad portion connected to the gate circuit portion, a display substrate defined by a cutting line, and a region surrounding the cell surrounding the display substrate A gate inspection pad unit for receiving a gate inspection signal, a gate inspection wiring unit connecting the gate inspection pad unit and the gate pad unit, and a short of the gate inspection wiring unit connected to the gate inspection wiring unit and It includes a switching unit for controlling the open (open). According to this, during the array inspection process, the switching unit is turned on to perform the array inspection process, and before and after the array inspection process, the switching unit is turned off to prevent the static electricity from flowing into the display substrate. You can. The gate circuit portion formed on the display substrate may be protected from static electricity.
机译:用于显示基板的母基板包括多条栅极线,用于驱动栅极线的栅极电路部分,和连接至该栅极电路部分的栅极焊盘部分,由切割线限定的显示基板以及围绕该栅极线的区域。围绕显示基板的单元:用于接收栅极检查信号的栅极检查垫单元,连接该栅极检查垫单元和该栅极垫单元的栅极检查布线单元,以及连接至该栅极检查布线单元的栅极检查布线单元的短路包括用于控制断开(断开)的开关单元。据此,在阵列检查过程中,接通开关单元以执行阵列检查过程,并且在阵列检查过程之前和之后,断开开关单元以防止静电流入显示基板。您可以。可以保护形成在显示基板上的栅极电路部分免受静电影响。

著录项

  • 公开/公告号KR102105369B1

    专利类型

  • 公开/公告日2020-04-29

    原文格式PDF

  • 申请/专利权人 삼성디스플레이 주식회사;

    申请/专利号KR20130113855

  • 发明设计人 김지선;채종철;권영근;

    申请日2013-09-25

  • 分类号G02F1/1345;G02F1/133;

  • 国家 KR

  • 入库时间 2022-08-21 11:04:45

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