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The substrate effect in electron energy-loss spectroscopy of localized surface plasmons in gold and silver nanoparticles

机译:金和银纳米粒子中局部表面等离子体的电子能量损失谱的基质效应

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摘要

Electron energy-loss spectroscopy (EELS) has become increasingly popular for detailed characterization of plasmonic nanostructures, owing to the unparalleled spatial resolution of this technique. The typical setup in EELS requires nanoparticles to be supported on thin substrates. However, as in optical measurements, the substrate material can modify the acquired signal. Here, we have investigated how the EELS signal recorded from supported silver and gold spheroidal nanoparticles at different electron beam impact parameter positions is affected by the choice of a dielectric substrate material and thickness. Consistent with previous optical studies, the presence of a dielectric substrate is found to redshift localized surface plasmons, increase their line-widths, and lead to increased prominence of higher order modes. The extent of these modifications heightens with increasing substrate permittivity and thickness. Specific to EELS, the results highlight the importance of the beam impact parameter and substrate related Čerenkov losses and charging. Our experimental results are compared with and corroborated by full-wave electromagnetic simulations based on the boundary element method. The results present a comprehensive study of substrate induced modifications in EELS and allow identification of optimal substrates relevant for EELS studies of plasmonic structures.
机译:由于该技术无与伦比的空间分辨率,电子能量损失谱(EELS)越来越广泛地用于等离子体纳米结构的详细表征。 EELS中的典型设置要求将纳米颗粒支撑在薄基板上。然而,如在光学测量中一样,衬底材料可以修改所获取的信号。在这里,我们研究了电介质衬底材料和厚度的选择如何影响从负载的银和金球形纳米颗粒在不同的电子束冲击参数位置记录的EELS信号。与先前的光学研究一致,发现电介质基板的存在会使局部表面等离激元红移,增加其线宽并导致高阶模态的突出性增加。这些修饰的程度随着基底介电常数和厚度的增加而增加。特定于EELS的结果强调了光束冲击参数和与基材相关的Čerenkov损耗和电荷的重要性。我们的实验结果与基于边界元法的全波电磁仿真进行了比较和证实。结果提供了对EELS中底物诱导的修饰的全面研究,并允许鉴定与等离子结构的EELS研究相关的最佳底物。

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