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Third- and fifth-order optical nonlinearities characterization using the D4σ-Z-scan method

机译:使用D4σ-Z扫描方法表征三阶和五阶光学非线性

摘要

We solved analytically the equations governing the evolution of the intensity and phase shift inside a nonlinear medium taking into account third- and fifth-order nonlinear susceptibilities. We give explicit expression of the propagation distance and the phase shift versus the output intensity. This solution is inverted numerically by means of Newtonu27s method. The result does not apply to some special cases due to the vanishing of coefficients, then analytical solutions are given, so that all the cases are covered. Combined with D4σ-Z-scan method, the third- and fifth-order nonlinear coefficients are measured at 532 nm and 1064 nm in the picosecond regime.
机译:考虑到三阶和五阶非线性磁化率,我们通过分析法求解了控制非线性介质内部强度和相移演化的方程。我们给出传播距离和相移对输出强度的明确表示。该解决方案通过牛顿法进行数值反演。由于系数的消失,该结果不适用于某些特殊情况,然后给出了解析解,从而涵盖了所有情况。结合D4σ-Z扫描法,在皮秒范围内分别在532 nm和1064 nm处测量了三阶和五阶非线性系数。

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