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Third- and Fifth-Order Optical Nonlinearities Characterization Using the D4σ-Z-Scan Method

机译:使用D4σ-Z扫描方法的三阶和第五级光学非线性表征

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We solved analytically the equations governing the evolution of the intensity and phase shift inside a nonlinear medium taking into account third- and fifth-order nonlinear susceptibilities. We give explicit expression of the propagation distance and the phase shift versus the output intensity. This solution is inverted numerically by means of Newton's method. The result does not apply to some special cases due to the vanishing of coefficients, then analytical solutions are given, so that all the cases are covered. Combined with D4σ-Z-scan method, the third- and fifth-order nonlinear coefficients are measured at 532 nm and 1064 nm in the picosecond regime.
机译:我们在考虑到第三和第五阶非线性敏感性的非线性培养基内强度和相移的演变的方程来解决了标准的方程。我们给出了传播距离的显式表达和相移与输出强度。通过牛顿的方法数值倒置该解决方案。由于系数的消失,结果不适用于一些特殊情况,然后给出分析解决方案,因此覆盖了所有情况。结合D4Σ-Z扫描方法,在Pic秒内的532nm和1064nm处测量第三和第五阶非线性系数。

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