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Ion-Optics Systems Of Multiply Charged High-Energy Ions For High Emittance Beams

机译：用于高发射光束的多电荷高能离子的离子光学系统

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Naidenov Baranova Gusinskii; V. O. Naidenov; L. A. Baranova; G. M. Gusinskii; A. V. Matyukov; S. Ya. Yavor;
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年度 2007
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1. Evidence for high-energy and low-emittance electron beams using ionization injection of charge in a plasma wakefield accelerator [J] . Vafaei-Najafabadi N., An W., Clayton C. E., Plasma physics and controlled fusion . 2016,第3期

机译：在等离子流场加速器中使用电离注入电荷获得高能和低发射率电子束的证据
2. Towards calibration and characterization of high-energy beams using charged particle retrodiffusion on a double thin carbon foil system [J] . G. Chene, F. Mathis, T. Dupuis, Nuclear instruments and methods in physics research . 2010,第11a12期

机译：在双薄碳箔系统上使用带电粒子逆扩散进行高能束的校准和表征
3. Studies of emittance of multiply charged ions extracted from high temperature superconducting electron cyclotron resonance ion source, PKDELIS a [J] . G. Rodrigues, P. S. Lakshmy, Sarvesh Kumar, Review of Scientific Instruments . 2010,第2期

机译：高温超导电子回旋共振离子源PKDELIS a 提取的多电荷离子的发射率研究
4. ION-OPTICS SYSTEMS OF MULTIPLY CHARGED HIGH-ENERGY IONS FOR HIGH EMITTANCE BEAMS [C] . V.O.Naidenov, L.A.Baranova, G.M.Gusinskii, Particle accelerator conference;Biennial particle accelerator conference . 1996

机译：高发射束的多电荷高能离子的离子光学系统
5. Evaluation of CT Image Quality of a Cone Beam Micro-CT system with Electron Multiplying CCD. [D] . Krishnakumar, Sumukh Bysani. 2016

机译：带有电子倍增CCD的锥形束微CT系统的CT图像质量评估。
6. Investigation of Noise and Contrast Sensitivity of an Electron Multiplying Charge-Coupled Device (EMCCD) based Cone Beam Micro-CT System [O] . Sumukh Bysani Krishnakumar, Alexander R. Podgorsak, SV Setlur Nagesh, -1

机译：基于电子倍增电荷耦合器件（EMCCD）的锥形束微CT系统的噪声和对比度灵敏度的研究
7. Beam structure and transverse emittance studies of high-energy ion beams [O] . K. Saadatmand, K.F. Johnson, J.D. Schneider -1

机译：高能量离子束的梁结构和横向发射研究
8. Beam structure and transverse emittance studies of high-energy ion beams. [R] . K. Saadatmand K. F. Johnson J. D. Schneider 1991

机译：高能离子束的束流结构和横向发射率研究。

Ion-Optics Systems Of Multiply Charged High-Energy Ions For High Emittance Beams

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