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Optical instrumentation and characterization for magnetooptical recording media.

机译:磁光记录介质的光学仪器和特性。

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摘要

This dissertation presents instrumentation developed for the optical characterizations of magneto-optic (M-O) recording media and explores the magneto-optic Kerr effect in optical recording applications. We developed an accurate method to measure the wavelength dependencies of the magneto-optic Kerr rotation angle θ(k), ellipticity ε(k) and reflectivity R and applied it to the characterization of TbFe and TbFeCo rare earth-transition metal (RE-TM) samples and Co/Pt and Co/Pd superlattice thin films. A variable-angle photometric ellipsometer system is developed for the dielectric tensor characterization of the M-O media. A series of Co/Pd samples with different thicknesses are studied for the understanding of M-O Kerr effect. The composition dependencies of the dielectric tensor for both Co/Pt and Co/Pd superlattice samples are measured, and the enhancement of the magneto-optic Kerr effect for these samples is studied. We also characterized many RE-TM samples and some non-magnetic dielectric, organic, sol-gel and metallic thin films. A semiclassical theory is proposed to describe the wavelength dependence of the magneto-optical Kerr effect. The theory takes into account the effects of the spin-orbit interaction, the band structure of the magnetic electrons and the phenomenological elements of the classical Drude model for the dielectric constant. Analytical formulas for the dielectric constants demonstrate explicitly how the Kerr rotation, the ellipticity and the reflectivity are related to the spin-orbit interaction, the band structure and several phenomenological parameters, such as the number density and relaxation timed of the free electrons. This model is applied to the bulk Co materials and the physics of the magneto-optic Kerr effect in these media is studied. Then we apply the theory to our measurements of the wavelength dependence of θ(k), ε(k) and R in a series of multilayered Co/Pt and Co/Pd thin films, covering the range of the 1.2-3.6 eV. With several adjustable parameters we have obtained a satisfactory match between the theory and the experimental data.
机译:本文介绍了为磁光(M-O)记录介质的光学特性开发的仪器,并探讨了磁光Kerr效应在光学记录应用中的应用。我们开发了一种精确的方法来测量磁光Kerr旋转角θ(k),椭圆率ε(k)和反射率R的波长依赖性,并将其应用于TbFe和TbFeCo稀土过渡金属(RE-TM)的表征)样品以及Co / Pt和Co / Pd超晶格薄膜。开发了可变角度光度椭圆仪系统,用于表征M-O介质的介电张量。研究了一系列不同厚度的Co / Pd样品,以了解M-O Kerr效应。测量了Co / Pt和Co / Pd超晶格样品的介电张量的成分依赖性,并研究了这些样品的磁光Kerr效应的增强。我们还对许多RE-TM样品以及一些非磁性电介质,有机,溶胶-凝胶和金属薄膜进行了表征。提出了一个半经典理论来描述磁光克尔效应的波长依赖性。该理论考虑了自旋轨道相互作用,磁电子的能带结构以及经典Drude模型的介电常数的现象学元素的影响。介电常数的解析公式清楚地说明了Kerr旋转,椭圆率和反射率与自旋轨道相互作用,能带结构和一些现象学参数(如自由电子的数量密度和弛豫时间)如何相关。该模型应用于块状钴材料,并研究了这些介质中磁光克尔效应的物理性质。然后,我们将该理论应用于一系列覆盖Co / Pt和Co / Pd的多层薄膜中θ(k),ε(k)和R的波长相关性的测量,覆盖范围为1.2-3.6 eV。通过几个可调参数,我们在理论和实验数据之间获得了令人满意的匹配。

著录项

  • 作者

    Zhou Andy Fenglei.;

  • 作者单位
  • 年度 1992
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  • 原文格式 PDF
  • 正文语种 en
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