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Simultaneous alignment and figure testing of optical system components via aberration measurement and reverse optimization.

机译:通过像差测量和反向优化同时进行光学系统组件的对准和图形测试。

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摘要

Optical component alignment and testing using reverse optimization has been investigated for different measurement methods and optical systems. The methods discussed were ray aberration measurement and wavefront aberration measurement. The methods were applied to real and simulated optical systems and compared. A testbed was designed to measure ray aberrations by means of physical raytracing of a three-mirror telescope in order to align the telescope by means of ray aberration measurement and reverse optimization, a technique of computer aided alignment. Ray aberration measurements were used to align the three-mirror telescope. Experimental results and improvements to the technique are discussed. Wavefront aberration methods are described and compared to ray aberration measurements. The wavefront aberration method was more easily used with systems with low nominal aberrations and when figure testing is desired. The ray aberration technique is most useful with systems of large aberration when capture range may be a problem and when component figure is well known. The method of reverse optimization is shown to work for wavefront aberration measurements in computer simulations using a Cassegrainian telescope, Cooke triplet and afocal two-Petzval telescope. Component figure errors and misalignments were determined simultaneously with sufficient spatial sampling of the wavefront aberrations. Surface parameters and component alignments were used as optimization variables. The effects of gaussian noise on the wavefront data were simulated for misalignment of the two-Petzval design. Results showed that noise can be compensated by the use of large numbers of optimization targets. Wavefront aberration measurements and reverse optimization were used to align a laboratory two-Petzval system to verify the results of the simulations.
机译:已针对不同的测量方法和光学系统研究了使用反向优化的光学组件对准和测试。讨论的方法是射线像差测量和波前像差测量。将该方法应用于实际和模拟光学系统并进行了比较。设计了一个试验台,通过三镜望远镜的物理光线追踪来测量光线像差,以便通过光线像差测量和反向优化(一种计算机辅助对齐技术)来对齐望远镜。光线像差测量用于对准三镜望远镜。讨论了实验结果和对该技术的改进。描述了波前像差方法,并将其与射线像差测量进行了比较。波前像差方法更容易用于标称像差低的系统以及需要进行图形测试的情况。当捕获范围可能是一个问题并且组件图众所周知时,射线像差技术对于大像差系统最有用。在使用卡塞格伦望远镜,库克三重透镜和无焦点两佩兹伐望远镜的计算机模拟中,逆向优化方法可用于波前像差测量。在对波前像差进行足够的空间采样的同时,确定了组件图形的误差和未对准。表面参数和组件对齐方式用作优化变量。模拟了高斯噪声对波前数据的影响,以消除两Petzval设计的偏差。结果表明,可以通过使用大量优化目标来补偿噪声。波前像差测量和反向优化被用于对准实验室的两个Petzval系统,以验证仿真结果。

著录项

  • 作者

    Lundgren Mark Andrew.;

  • 作者单位
  • 年度 1990
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  • 原文格式 PDF
  • 正文语种 en
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