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正バイアス印加マイクロ波プラズマCVDによる高配向ダイヤモンド膜の形成に関する研究

机译:正偏压微波等离子体CVD形成高取向金刚石膜的研究

摘要

Diamond films of good crystal quality have been expected in various phases ofapplications, especially for electron devices at high temperatures and at high electricfields. Single crystalline diamond films have been realized by homoepitaxial growth ondiamond substrates. Heteroepitaxial growth of diamond films have also been attemptedon various substrates, but the films are composed in general of diamond grains. SiC isone of the substrates appropriate for this purpose because of its similar chemicalaffinity with diamond. However, the growth of diamond films on Si substrates is highlydesired for the application to Si LSI, not only because of cost but also a possibility ofintegration into Si LSI. There is however a large lattice mismatch between diamond andsilicon and a large difference of the surface energy. So far, various methods have beenreported on the synthesis of diamond films on Si substrates, e.g., filament method, RFand microwave plasma CVD (MPCVD) methods. In general, heteroepitaxial growth ofdiamond films on Si forms polycrystalline diamond films composed of diamond grainswith different crystal orientations. B-doped diamond films have also been grown andthe reported Hall mobilities were by one order of magnitude lower than those obtainedfor homoepitaxial diamond films grown on natural diamond substrates. The lowmobility of heteroepitaxial diamond films may be ascribed to bad crystallinity of grains,small grain size and diverse grain orientation. Therefore, formation of highly orienteddiamond films of large grain sizes on Si substrates has been of great interests forelectron device applications.The BEN (Bias Enhanced Nucleation) method has been widely used to increase thenucleation sites (~1010 /cm2) on Si and other substrates in heteroepitaxial growth ofdiamond films by MPCVD. It is a pre-treatment of the surface of substrates under anegative bias at relatively high CH4 concentrations prior to diamond growth. After theBEN treatment, the growth of diamond films is in general carried out under no bias.In the process of MPCVD of diamond films, hydrogen atoms generated in largequantity in the plasma play an important role. They accelerate the gas phase reactionand promote the formation of radicals, and help stabilize the growing sp3-bondeddiamond surface. They also etch the non-diamond components such as graphite andamorphous carbon. Radicals such as methyl radicals (CH3*) also enhance the growth ofdiamond films. On the other hand, ions impinging on the substrates would causephysical etching of growing diamond grains and also form new nucleation sites ongrains, resulting in diversely oriented growth of diamond grains. Consequently, it isexpected that a reduction of ions impinging into the substrate as well as an increase ofradicals on the substrate surface would improve the grain size, the growth rate, thecrystal quality and the degree of the grain orientation. In the MPCVD diamond, it wasreported that the surface applied a positive bias was smooth, whereas the surfaceapplied a negative bias was rough probably due to ion damage.This study deals with the effects of a positive bias to the Si (100) substrates duringthe MPCVD diamond growth process on the growth and quality of diamond films. It isshown that the positive bias enhances the grain size, the growth rate and the (100)grain orientation. It is also shown that the positive bias increases the hole Hall mobilityof B-doped diamond films grown on Si substrates.
机译:在不同的应用阶段,尤其是在高温和高电场下的电子设备中,都希望获得具有良好晶体质量的金刚石薄膜。通过在金刚石衬底上同质外延生长已经实现了单晶金刚石膜。还尝试了在各种基底上异质外延生长金刚石膜,但是该膜通常由金刚石晶粒组成。 SiC是适用于此目的的基材之一,因为它与钻石的化学亲和力相似。然而,不仅由于成本,而且由于集成到Si LSI中的可能性,迫切需要在Si衬底上生长金刚石膜以用于Si LSI。但是,金刚石和硅之间存在很大的晶格失配,并且表面能差异很大。迄今为止,已经报道了在Si衬底上合成金刚石膜的各种方法,例如细丝法,RF和微波等离子体CVD(MPCVD)法。通常,在Si上金刚石薄膜的异质外延生长会形成由具有不同晶体取向的金刚石晶粒组成的多晶金刚石薄膜。也已经生长了掺B的金刚石膜,并且所报道的霍尔迁移率比在天然金刚石基底上生长的同质外延金刚石膜所获得的霍尔迁移率低一个数量级。异质外延金刚石膜的迁移率低可能归因于晶粒的结晶度差,晶粒尺寸小和晶粒取向不同。因此,在硅衬底上形成大晶粒尺寸的高取向金刚石膜已成为电子设备应用的重要兴趣.Ben(Bias Enhanced Nucleation)方法已被广泛用于增加Si和其他衬底上的成核位点(〜1010 / cm2)。 MPCVD技术在金刚石薄膜异质外延生长中的应用这是在金刚石生长之前,在相对较高的CH4浓度下,在负偏压下对基材表面进行的预处理。经过BEN处理后,金刚石薄膜的生长通常是无偏压的。在金刚石薄膜的MPCVD工艺中,等离子体中大量产生的氢原子起着重要的作用。它们加速了气相反应并促进了自由基的形成,并有助于稳定了与sp3键合的金刚石表面的生长。他们还蚀刻非金刚石成分,例如石墨和非晶碳。诸如甲基自由基(CH3 *)之类的自由基也可以促进金刚石膜的生长。另一方面,撞击在基底上的离子将引起正在生长的金刚石晶粒的物理蚀刻,并且还会在晶粒上形成新的成核位置,从而导致金刚石晶粒的取向不同。因此,可以预期的是,入射到基板上的离子的减少以及基板表面上自由基的增加将改善晶粒尺寸,生长速率,晶体质量和晶粒取向度。据报道,在MPCVD金刚石中,施加正偏压的表面很光滑,而施加负偏压的表面则可能是由于离子损伤而变得粗糙。本研究研究了MPCVD期间正偏压对Si(100)衬底的影响金刚石的生长过程对金刚石膜的生长和质量的影响。结果表明,正偏压可提高晶粒尺寸,生长速率和(100)晶粒取向。还显示出正偏压增加了在Si衬底上生长的B掺杂金刚石膜的空穴霍尔迁移率。

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