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Design and development of a profilometer for the fast and accurate characterization of optical surfaces

机译:用于快速,准确表征光学表面的轮廓仪的设计和开发

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摘要

With the advent of techniques devised for the mass production of optical components made with surfaces of arbitrary form (also known as free form surfaces) in the last years, a parallel development of measuring systems adapted for these new kind of surfaces constitutes a real necessity for the industry. Profilometry is one of the preferred methods for the assessment of the quality of a surface, and is widely employed in the optical fabrication industry for the quality control of its products. In this work, we present the design, development and assembly of a new profilometer with five axis of movement, specifically suited to the measurement of medium size (up to 150 mm of diameter) "free-form" optical surfaces with sub-micrometer accuracy and low measuring times. The apparatus is formed by three X, Y, Z linear motorized positioners plus and additional angular and a tilt positioner employed to locate accurately the surface to be measured and the probe which can be a mechanical or an optical one, being optical one a confocal sensor based on chromatic aberration. Both optical and mechanical probes guarantee an accuracy lower than the micrometer in the determination of the surface height, thus ensuring an accuracy in the surface curvatures of the order of 0.01 D or better. An original calibration procedure based on the measurement of a precision sphere has been developed in order to correct the perpendicularity error between the axes of the linear positioners. To reduce the measuring time of the profilometer, a custom electronics, based on an Arduino (TM) controller, have been designed and produced in order to synchronize the five motorized positioners and the optical and mechanical probes so that a medium size surface (around 10 cm of diameter) with a dynamic range in curvatures of around 10 D, can be measured in less than 300 seconds (using three axes) keeping the resolution in height and curvature in the figures mentioned above.
机译:近年来,随着为大规模生产由任意形式的表面(也称为自由形式的表面)制成的光学组件而设计的技术的出现,适用于这些新型表面的测量系统的并行开发构成了制造电子设备的真正必要。行业。轮廓测定法是评估表面质量的优选方法之一,并且在光学制造行业中广泛用于对其产品的质量控制。在这项工作中,我们介绍了具有五个运动轴的新型轮廓测量仪的设计,开发和组装,特别适合于测量中等尺寸(直径最大150毫米),亚微米精度的“自由形式”光学表面测量时间短。该设备由三个X,Y,Z线性电动定位器加以及附加的角度和倾斜定位器组成,这些定位器用于精确定位要测量的表面,探头可以是机械的或光学的,光学的是共聚焦传感器基于色差。在确定表面高度时,光学探头和机械探头都保证精度低于千分尺,从而确保表面曲率精度达到0.01 D或更高。为了校正线性定位器的轴之间的垂直度误差,已经开发了基于精确球体测量的原始校准程序。为了减少轮廓仪的测量时间,已设计并生产了一个基于Arduino(TM)控制器的定制电子设备,以同步五个电动定位器以及光学和机械探针,从而使表面尺寸中等(大约10可以在不到300秒(使用三个轴)的范围内测量曲率动态范围大约为10 D的直径(直径1厘米),并保持上述图中的高度和曲率分辨率。

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