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Spectral multiplexing using quantum dot tagged microspheres with diffusing colloidal probe microscopy

机译:使用量子点标记的微球和扩散胶体探针显微镜进行光谱复用

摘要

This work involves the development of a new technique that integrates DiffusingColloidal Probe Microscopy (DCPM) and luminescence to simultaneously measuremultiple particle-wall interactions. DCPM can be used to map potential energy profiles ofmultiple particle-surface interactions simultaneously and accurately. Colloidalsemiconductor quantum dots were used for spectral multiplexing to enable monitoring ofmultiple analytes at the same time.DCPM combines Total Internal Reflection Microscopy (TIRM) and VideoMicroscopy to simultaneously measure multiple particle-surface interactions withnanometer resolution in particle-surface separation. By acquiring the scattered intensityemitted by the particles, the separation distance can be calculated and subsequently theforces of interactions between the particle and the surface.This work demonstrates the use of luminescence instead of scattering as the modeof detection in DCPM. The luminescence is provided by quantum dots which areincorporated into polystyrene microspheres. The unique optical properties of quantumdots enable the creation of an optically multiplexed system where microspheres aretagged by quantum dots of different emission wavelengths. Scattering in DCPM may result in erroneous calculation of the potential energyprofiles because of particle polydispersity. Since scattering is dependent on particle size,luminescence is introduced into the system and some interesting results are obtained.These results illustrate that the effect of particle polydispersity is significantly reducedwhen luminescence is used as the mode of detection. This combined with the DCPMsystem?s sensitivity would enable the monitoring of multiple functionalized particlesurfaceinteractions simultaneously and accurately.
机译:这项工作涉及一项新技术的开发,该技术集成了扩散胶体探针显微镜(DCPM)和发光技术,可同时测量多个粒子-壁之间的相互作用。 DCPM可用于同时且准确地绘制多个粒子-表面相互作用的势能曲线。胶体半导体量子点用于光谱多路复用,可同时监控多种分析物.DCPM结合了全内反射显微镜(TIRM)和视频显微技术,可同时测量多个颗粒-表面相互作用,并且在颗粒-表面分离中具有纳米分辨率。通过获取粒子发出的散射强度,可以计算出分离距离,并随后计算出粒子与表面之间相互作用的力。这项工作证明了使用发光代替散射作为DCPM的检测方式。发光由掺入聚苯乙烯微球的量子点提供。量子点的独特光学特性使得能够创建光学多路复用系统,其中微球被不同发射波长的量子点标记。由于颗粒的多分散性,DCPM中的散射可能导致对势能分布的错误计算。由于散射取决于颗粒大小,因此将发光引入系统中,并获得了一些有趣的结果。这些结果表明,当将发光用作检测方式时,显着降低了颗粒多分散性的影响。结合DCPM系统的灵敏度,可以同时且准确地监视多个功能化的粒子表面相互作用。

著录项

  • 作者

    Muthukumar Shankarapandian;

  • 作者单位
  • 年度 2009
  • 总页数
  • 原文格式 PDF
  • 正文语种 en_US
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