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Reliability Growth Predication based on an Improved Grey Predicton Model

机译:基于改进灰色预测模型的可靠性增长预测

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摘要

As limits of time, labors and expenses, observed data usually have the characteristic of small sample sizes in development test program. Redesigns or corrective actions can result in changes of reliability for equipments. We propose an improved GM(1,1) model to predict reliability growth in this paper. First, a newly initial condition in time response function is set in this improved GM(1,1) model. The newly initial condition is comprised of the first item and the last item of a sequence which is generated from applying the first-order accumulated generation operator to a sequence of raw data. Then the improved model can express the principle of new information priority well and improve prediction precision through fully applying new information in raw data. Secondly, we make use of the improved model to predict reliability growth in a numerical example. The comparison of predicted reliability growth curve from the improved GM(1,1) model and that from the Lloyd-Lipow model indicates that the improved GM(1,1) model is much better than the Lloyd-Lipow model for the reliability growth prediction.
机译:作为时间的限制,劳动力和费用,观察到的数据通常具有开发测试程序中小样本尺寸的特征。重新设计或纠正措施可能导致设备可靠性的变化。我们提出了一种改进的GM(1,1)模型来预测本文的可靠性增长。首先,在该改进的GM(1,1)模型中设置了时间响应函数的新初始条件。新初始条件包括第一项和序列的最后一项,这些序列由将一阶累积的生成运算符应用于原始数据序列而生成。然后,改进的模型可以通过完全应用原始数据中的新信息来表达新信息优先级的原理,提高预测精度。其次,我们利用改进的模型来预测数值示例中的可靠性增长。从改进的GM(1,1)模型的预测可靠性生长曲线和来自LLOYD-LIPOW模型的预测可靠性生长曲线的比较表明,改进的GM(1,1)模型比可靠性增长预测的LLOYD-LIPOW模型好得多。

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