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The Effect of Deposition Parameters on the Structure and Mechanical Properties of Chromium Oxide Coatings Deposited by Reactive Magnetron Sputtering

机译:沉积参数对反应磁控溅射沉积铬氧化铬涂层结构和力学性能的影响

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摘要

Appropriate conditions for depositing hard Cr2O3 coatings by reactive sputtering techniques have yet to be defined. To fill this gap, the effect of principal deposition parameters, including deposition pressure, temperature, Cr-target voltage, and Ar/O2 ratio, on both the structure and mechanical properties of chromium oxide coatings was investigated. A relationship between processing, structure, and the mechanical properties of chromium oxide coatings was established. Scanning electron microscopy (SEM), X-ray diffraction (XRD), Raman spectroscopy, and X-ray Photoelectron Spectroscopy (XPS) were used to characterize the morphology, structure, and chemical compositions of the coatings that were prepared. An optical profilometer was employed to measure both the roughness and thickness of the coatings. The hardness and Young’s modulus of the coatings both as-deposited and after annealing conditions were measured by nanoindentation. The results showed that depositing hard Cr2O3 coatings is a highly critical task, requiring special deposition conditions. Cr2O3 coatings with a high hardness of approximately 25 GPa could be achieved at room temperature, at a low pressure of 1.6 × 10−1 Pa, where Cr-target voltage and oxygen content were 260 V and between 15–25 vol % of total gas, respectively. A dense stoichiometric Cr2O3 structure was found to be responsible for the high chromium oxide coating hardness observed.
机译:用于沉积由反应溅射技术硬涂层的Cr2O3适当的条件还没有被定义。为了填补这一空白,主要沉积参数,包括沉积压力,温度,铬目标电压,且Ar / O2比的效果,在该结构上和氧化铬涂层的机械性能都进行了研究。成立处理,结构和氧化铬涂层的机械性能之间的关系。扫描电子显微镜(SEM),X射线衍射(XRD),拉曼光谱和X射线光电子能谱(XPS)进行了表征形态,结构和制备的涂层的化学组成。光学轮廓用来测量两个粗糙度和涂层的厚度。硬度和涂层的杨氏模量通过纳米压痕测量的既作为沉积和后退火条件。结果表明,沉积硬Cr2O3陶瓷涂层是一个非常重要的任务,需要特殊的沉积条件。 Cr2O3陶瓷涂层具有约25 GPa的高硬度可以在室温下实现,在1.6×10-1帕,其中铬的目标电压和氧含量分别为260伏的低压和总气体的15-25%(体积)之间, 分别。致密的化学计量的Cr2O3结构被认为是负责高铬氧化物涂层观察硬度。

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