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Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects

机译：可靠性逻辑合成：早期开始控制电迁移和热载波效应

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K. Roy; S. Prasad;
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年度 1995
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1. Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects [J] . Roy K., Prasad S. IEEE Transactions on Reliability . 1995,第2期

机译：逻辑综合以提高可靠性：尽早开始控制电迁移和热载流子效应
2. Efficient Application of Hot-Carrier Reliability Simulation to Delay Library Screening for Reliability of Logic Designs [J] . Hisako SATO, Mariko OHTSUKA, Kazuya MAKABE, IEICE Transactions on Electronics . 2003,第5期

机译：热载可靠性仿真在延迟库筛选中提高逻辑设计的可靠性
3. Controlled electromigration of thin Pb films started from the normal and from the superconducting state [J] . Staudt D., Hoffmann-Vogel R. Journal of Physics, D. Applied Physics: A Europhysics Journal . 2017,第18期

机译：薄PB薄膜的受控电迁移从正常和超导状态开始
4. Logic synthesis for reliability---an early start to controlling electromigration and hot carrier effects [C] . Kaushik Roy, Sharat Prasad French-Speaking Conference on Mobility and Ubiquity Computing . 2009

机译：逻辑综合提高可靠性-控制电迁移和热载流子效应的早期开始
5. Fundamentals and applications of the hydrogen/deuterium isotope effect in improved hot-carrier reliability of MOS devices. [D] . Cheng, Kangguo. 2001

机译：氢/氘同位素效应在提高MOS器件的热载流子可靠性方面的基础和应用。
6. The Inter-Session Reliability of Isometric Force-Time Variables and the Effects of Filtering and Starting Force [O] . Dr Gavin L. Moir, Aaron Getz, Shala E. Davis, 2019

机译：等距力时间变量的会话间可靠性以及过滤和起始力的影响
7. Logic Synthesis for Reliability - An Early Start to Controlling Electromigration and Hot Carrier Effects [O] . Roy, Kaushik, Prasad, Sharat C. 1993

机译：可靠性的逻辑综合-控制电迁移和热载流子效应的早期开始
8. Hot-Carrier Reliability Design Guidelines for CMOS Logic Circuits [R] . Quader, K. N., Minami, E. R., Huang, W. J., 1993

机译：CmOs逻辑电路的热载流子可靠性设计指南

Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects

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