RADC/NBS (Rome Air Development Center/National Bureau of Standards) Workshop. Moisture Measurement and Control for Microelectronics (4)

摘要

The fourth Workshop on Moisture Measurement and Control for Microelectronics served as a forum on moisture and/or materials reliability problems and on ways to control them or measure their extent. Twenty-two presentations are included which contain detailed information on hermeticity measurement and definition; development of standard packages for mass spectrometric calibrations; moisture interaction with various materials; and techniques that can be used to measure moisture microelectronics. It was clear from several presentations in the workshop that a very systematic approach is needed when organic materials are involved; all the variables must be identified and studied one at a time. This is the key to lot-to-lot reproducibility, materials selection, and control; hence a better reliability at the design phase will decrease the need for testing; hence the cost, thus resulting in a greater satisfaction to the customer.