首页> 美国政府科技报告 >Measurement of the Configuration of a Concave Surface by the Interference of Reflected Light
【24h】

Measurement of the Configuration of a Concave Surface by the Interference of Reflected Light

机译:用反射光干涉测量凹面结构

获取原文

摘要

A method whereby a concave surface is irradiated with coherent light and the resulting interference fringes yield information on the concave surface is described. This method can be applied to a surface which satisfies the following conditions: (1) the concave face has a mirror surface; (2) the profile of the face is expressed by a mathematical function with a point of inflection. In this interferometry, multilight waves reflected from the concave surface interfere and make fringes wherever the reflected light propagates. Interference fringe orders. Photographs of the fringe patterns for a uniformly loaded thin silicon plate clamped at the edge are shown experimentally. The experimental and the theoretical values of the maximum optical path difference show good agreement. This simple method can be applied to obtain accurate information on concave surfaces.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号