Noise power spectral density of the Sundstrand QA-2000 accelerometer

摘要

There are no good data on low frequency (less than 0.1 Hz) power spectral density (PSD) for the Q-Flex accelerometer. However, some preliminary stability measurements were made over periods of 12 to 24 hours and demonstrated stability less than 0.5 micro-g over greater than 12 hours. The test data appear to contain significant contributions from temperature variations at that level, so the true sensor contribution may be less than that. If what was seen could be construed as a true random process, it would correspond to about 0.1 micro-g rms over a bandwidth from 10(exp -5) Hz to about 1 Hz. Other studies of low frequency PSD in flexure accelerometers have indicated that material aging effects tend to approximate a first order Markhov process. If we combine such a model with the spectrum obtained at higher frequencies, it suggests the spectrum shown here as a conservative estimate of Q-Flex noise performance.