Some Sources of Contaminants in the Shuttle Bay Measured with Temperature-Controlled Quartz Crystal Microbalances (TQCM)

摘要

The sources of molecular deposits on a Temperature-Controlled Quartz Crystal Microbalance (TQCM) attached to the shuttle bay wall at some distance from the payload and pointing out of the bay have been investigated. Explored as possible sources are: (1) the outgassing of the shuttle tiles treated with the water proofing di-methyl-ethoxy-silane (DMES) compound, scattered back by the ambient molecules into the bay; (2) The ambient scattered return flux of the outgassing, from the RTV 560 silicone which is used as the adhesive for the tiles; (3) the ambient scattered return flux of the payload outgassing; (4) the return C, flux from outgassing source originating near, below, or adjacent to the package containing the TQCM; and (5) the self-scattering of venting plumes and outgassing above the monitor package depositing on the TQCM. In all of these sources, the magnitudes of the outgassing, of the leakage rates, and venting had to be estimated in the absence of data. The resulting analyses which can be useful for similar investigations, indicates that the outgassin- from the tiles, the RTV, the payloads, or the shuttle may not have been the sources of the deposit (about 1 micro g/cm(sup 2) during a the period from bay door opening and payload release from the bay). It appears more probable that the origin is the self- and/or ambient-scattered return fluxes originating near, below, or internal to the monitor package.