Measuring device for testing operation of Quartz crystal oscillator used in computer system, compares characteristic size of quartz crystal oscillator with previously measured reference value of reference crystal oscillator

摘要

The device has a measuring head which is in contact with a quartz crystal oscillator (QX). The measuring head is connected to oscillator circuit (16). A microcontroller (13) is provided for driving the oscillator circuit. The characteristic size of the quartz crystal oscillator is compared with previously measured reference value of reference crystal oscillator. A display (5) is provided for displaying a value based on comparison result. An independent claim is included for method for testing operation of Quartz crystal oscillator.