CRYSTAL OSCILLATOR AND DRIVE CHARACTERISTIC MEASURING METHOD FOR QUARTZ OSCILLATOR IN THE SAME

摘要

PROBLEM TO BE SOLVED: To stably and precisely measure a drive characteristic even after a quartz oscillator is loaded on an oscillator. ;SOLUTION: An oscillation circuit part 12 is constituted of the DLD characteristic measuring circuit part 13 of a quartz oscillator, which is surrounded by an illustrated broken line, an active oscillator 14 formed of a transistor, which is for driving a quartz oscillator 11, and a function circuit 15 (burr cap capacitor in the case of VCXO and temperature compensation circuit in the case of TCXO) for adjusting and controlling a frequency. The DLD characteristic measuring circuit part 13 is constituted of a crystal current control circuit 13a controlling crystal current and varying the drive level of the crystal oscillator 11 and a variable resistor 13b connected in series to the quartz oscillator 11.;COPYRIGHT: (C)2001,JPO