THE TEM RADIATION PATTERN OF A THIN-WALLED PARALLEL-PLATE WAVEGUIDE ANALYZED BY A SURFACE INTEGRATION TECHNIQUE

摘要

The radiation pattern of a TEM mode thin-walled parallel-plate waveguide is analyzed by a surface integration technique in conjunction with wedge diffraction theory. The surface integral is obtained by the Green's second identity. The fields on the surface are calculated by plane wave diffraction and first order interactions between two edges of the guide (which were employed in a previous pattern analysis by the wedge diffraction method). The surface integration technique provides an improvement in the accuracy of the pattern as compared to the wedge diffraction method.