Capacitors; Cobalt Oxides; Lanthanum Oxides; PZT; Strontium Oxides; Coatings; Electrodes; Fatigue; Hysteresis; Materials Testing; Microstructure; Semiconductor Materials; Sputtering; Thin Films; Meetings;
机译:通过开尔文力显微镜对在La_(0.5)Sr_(0.5)CoO_3或LaMnO_3底部电极上生长的PbZr_(0.3)Ti_(0.7)O_3薄膜进行分析
机译:在La_(0.5)Sr_(0.5)CoO_3电极厚度的硅衬底上制备的Pb(Zr_(0.53)Ti_(0.47))O_3薄膜的取向控制
机译:厚度为La 0.5 s>的硅衬底上制备的Pb(Zr 0.53 sub> Ti 0.47 sub>)O 3 sub>薄膜的取向控制sub> Sr 0.5 sub> CoO 3 sub>电极
机译:(001)SrTiO_3上有无La_(0.5)Sr_(0.5)CoO_3电极层的外延PbZr_(0.5)Ti_(0.8)O_3膜的应力状态和域结构
机译:镧锶锰(LA0.67SR0.33MNO3)和锆钛酸铅(PBZR0.52TI0.48O3)薄膜异质结构中的自极化感应磁电耦合
机译:锡顶电极综合研究原子层沉积铁电HF0.5盎司薄膜
机译:在柔性非易失性存储器应用中,在Muscovite MICA上进行热稳定和辐射硬质电气HF0.5ZR0.5O2薄膜