Simple Constant-Magnification Specimen Holder for JEOL JSM-2Scanning Electron Microscope.

摘要

A versatile specimen handling system for the JEOL JSM-2scanning electron microscope has been devised. This system is comprised of a carriage,biasing spring,interchangeable masks,and three variations of specimen mounting stubs. Easy mounting of a wide variety of specimen geometries is facilitated while minimizing changes in magnification by holding the working distance constant.