X-Ray Transmission/Scattering Technique for Thickness-Independent Density Measurement

摘要

A nondestructive technique, using penetrating x radiation, has been developed to measure the density uniformity of low-Z, compressible materials that is independent of material thickness. Thickness independence is achieved by simultaneously monitoring the transmitted and scattered x rays. Results on samples of pressed carbon materials have demonstrated that there is the expected linear relationship between measured quantities and material density, independent of material thickness, and that this is a viable means of measuring density uniformity. (ERA citation 04:014485)