首页> 外国专利> Surface scattering type density measurement method and surface scattering type density measurement apparatus using the same

Surface scattering type density measurement method and surface scattering type density measurement apparatus using the same

机译:表面散射型密度测量方法和使用该方法的表面散射型密度测量设备

摘要

PURPOSE: To realize practical density measurement by conducting a corrective processing in consideration of the particle size of a sample to be measured. ;CONSTITUTION: A gamma-ray pulse is radiated from a radiation source 5 to a sample to be measured and a count value for a unit time of the gamma-ray pulse transmitted through the sample is determined for each of a plurality of energy ranges. Moreover, the value of a variable of the actual particle size of the sample is determined by substituting the count values in an approximation formula into which the variable of the particle size is introduced, and furthermore the true density is determined by substituting this value of the variable in an operation formula for calculating the density.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:通过考虑待测样品的粒径进行校正处理来实现实用的密度测量。组成:从辐射源5向要测量的样品辐射伽马射线脉冲,并针对多个能量范围中的每一个确定在样品中透射的伽马射线脉冲的单位时间的计数值。此外,通过将计数值代入引入了粒径的变量的近似公式中,来确定样品的实际粒径的变量的值,此外,通过将粒径的该值替代来确定真实密度。运算公式中用于计算密度的变量。版权所有:(C)1993,JPO&Japio

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