首页> 外文期刊>X-Ray Spectrometry: An International Journal >Three-dimensional density measurements of ultra low density materials by X-ray scatter using confocal micro X-ray fluorescence spectroscopy
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Three-dimensional density measurements of ultra low density materials by X-ray scatter using confocal micro X-ray fluorescence spectroscopy

机译:使用共聚焦微X射线荧光光谱仪通过X射线散射对超低密度材料进行三维密度测量

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Targets used in high energy density physics experiments, such as those fielded at the National Ignition Facility, are typically made of multi-component systems that include metals, metal coatings, and very low density materials. These very low density materials with densities as low as ~10 mg/cm~3 must have uniform density throughout. Characterizing their density in 3D is a very difficult problem. One technique used is confocal micro X-ray fluorescence. This technique, which uses a polycapillary optic to focus the X-rays from the X-ray source and another on the detector, measures the density of these materials based upon their X-ray scatter. In order to gain a complete picture of their X-ray scatter, the sample is rastered in 3D to generate a complete 3D density map. As proof of technique, the examination of very low density poly(styrene-divinylbenzene) foams, poly(methylpentene) foams, as well as silica aerogels were completed. Results for the polymer foam materials show a linear correlation (R~2 = 0.99) between X-ray scatter intensity and bulk density. However, for higher atomic number materials (e.g. aerogels) the amount of X-ray scatter is very dependent upon the depth of data collection as a result of the absorption of the X-rays by the upper portions of the sample. This self-absorption reduces the ability of this technique to quantify the density of the material in full 3D. Self-absorption modeling will be required to compensate. Scans through the aerogel surface indicate an increased density at the surface due processing. Finally, a 3D image of a machined aerogel tube is presented.
机译:高能量密度物理实验中使用的目标(例如在国家点火设施中使用的目标)通常由包含金属,金属涂层和极低密度材料的多组分系统制成。这些密度非常低的材料,其密度必须低至〜10 mg / cm〜3。在3D中表征其密度是一个非常困难的问题。使用的一种技术是共聚焦微X射线荧光。该技术使用多毛细管光学器件将来自X射线源的X射线聚焦到另一个,并将另一个聚焦在检测器上,该技术基于这些材料的X射线散射来测量其密度。为了获得其X射线散射的完整图片,对样品进行3D栅格化以生成完整的3D密度图。作为技术证明,已完成了对极低密度聚(苯乙烯-二乙烯基苯)泡沫,聚(甲基戊烯)泡沫以及二氧化硅气凝胶的检查。聚合物泡沫材料的结果表明,X射线散射强度和堆积密度之间存在线性关系(R〜2 = 0.99)。但是,对于较高原子序数的材料(例如气凝胶),由于样品上部吸收了X射线,X射线散射的量非常取决于数据收集的深度。这种自吸收降低了这项技术在全3D模式下量化材料密度的能力。自吸收模型将需要补偿。穿过气凝胶表面的扫描表明,由于加工,表面密度增加。最后,显示了经过加工的气凝胶管的3D图像。

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