Microstrain and Defect Analysis of CL-20 Crystals by Novel X-Ray Methods

摘要

This project has demonstrated the capabilities of a new x-ray technique to detectand quantify microstrains and defects in semi-crystalline energetic materials. The technique is based on simultaneous rocking-curve analysis of individual particles. The technique was applied to the analysis of CL-20 particles to investigate the effects of synthesis, grinding and static loads on the extent of microstrain and defect development. Overall, these demonstrated capabilities can be employed by DoD in investigating and distinguishing between methods of crystallization and processing by utilizing measures of microstrain and on exploring relationships between crystal defect and microstrain density distributions versus ultimate properties.