首页> 美国政府科技报告 >Dual Band MWIR/LWIR Focal Plane Array Test Results
【24h】

Dual Band MWIR/LWIR Focal Plane Array Test Results

机译:双频mWIR / LWIR焦平面阵列测试结果

获取原文

摘要

We report the imaging test results of the first 2-color MWIRiLWIR 256 x 256 QWIP FPA with simultaneous integrating capability. The FPA studied contained stacked GaAs7AlGaAs QWIP structures with spectral peaks at 5.1 um and 9.0 um. Normally incident radiation was coupled into the device using a diffiaction grating designed to operate in both spectral bands. Each pixel is connected to the read-out integrated circuit by three bumps to permit the application of separate bias levels to each QWIP stack and allow simultaneous integration of the signal current in each band. We found the FPA to have high pixel opembility, well-balanced response, good imaging performance, high optical fill-factor, and low spectral crosstalk. Data are presented on measurements of the noise-equivalent temperature difference of the FPA in both bands as functions of bias and temperature. We also present data on the sensitivity of this FPA to polarized light.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号