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Probing Thin Film Thermophysical Properties Using the Femtosecond Transient ThermoReflectance Technique.

机译:利用飞秒瞬态热反射技术探测薄膜热物理特性。

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摘要

The objectives are as follows: Discuss Femtosecond Transient ThermoReflectance (FTTR) technique as a method for measuring the thermophysical properties of thin film materials. Demonstrate the measurement of the thermal diffusivity, electron-phonon coupling factor, and thermal boundary resistance of thin metallic films using the FTTR technique. Discuss the importance of considering the nonlinear relationship between reflectance and temperature. Present experimental results for Femtosecond Transient ThermoTransmittance (FTTT) studies performed on amorphous silicon solar cells.

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