Test Generation for Very High-Level Design Language (VHDL) specifications Used in Avionics.

摘要

This report describes a technique that automatically generates test pattern sequences for digital systems based on VHDL inputs. This research aims to design a method for detection and elimination of inconsistencies in the Extended Finite State Machine (EFSM) directed graph model of the VHDL by splitting the graph vertices and duplicating the edges minimally. It focuses mainly on detection and removal of condition-to-condition and action-to-action inconsistencies. Section 1 describes the general problem and lists different tools that already exist. Section 2 describes the algorithm for detection and removal of condition-to- condition inconsistencies. Section 3 presents a pseudocode of the combined detection/removal condition-to- condition inconsistencies. Section 4 describes the algorithm for detection and removal of action-to-action inconsistencies. Section 5 presents a pseudocode of the combined detection/removal action-to-action inconsistencies. Section 6 describes the implementation of the algorithm in C along with some examples.