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Fast Detection of High Power Microwave Signals using a Asymmetrically Shaped Semiconductor Structures

机译:利用非对称半导体结构快速检测高功率微波信号

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This report results from a contract tasking Semiconductor Physics Institute as follows: The contractor will investigate methods of creating a fast detector of high power microwave radiation that can measure the amplitude of the pulses of nanoseconds duration in the order of 100 kW. The contractor's investigation will include: 1. Detection properties of asymmetrically shaped semiconductor structure, fabricated on the base of silicon single crystal; 2. Suitability of the device to detect high power microwave signals using asymmetrically shaped AlGaAs structures. The contractor will deliver 12 asymmetrically shaped sensors to: Dr John Gaudet, AFRL/DE, Bldg 909, 3550 Aberdeen Ave SE, Kirtland AFB NM 87117-5776.

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