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Development of Variable Temperature Scanning Laser Microscope for Diagnosing Coated Conductors

机译:用于诊断涂层导体的变温扫描激光显微镜的研制

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Dr. Kwon's group achieved the main technical goal of the proposed research by demonstrating the applicability of variable temperature scanning laser microscopy (vTsLM) in coated conductor diagnosis. In the first year, they set up VTSLM, computerized instrument control, investigated epitaxial films, and corroborated the validity of VTSLM measurements. The major accomplishments of the second year are the development of image processing computer programs to obtain the spatial map of superconducting transition temperature and current distribution as well as obtaining such maps in coated conductors. During the last year, more new results were obtained showing the qualitative differences between IBAD and RABITS coated conductors and establishing a correlation between VTSLN image and local superconducting dissipation.

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