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AN INSTRUMENT FOR MEASURING THE SPECTRAL EMITTANCE OF A SOLID IN THE INFRARED FROM 16 TO 45 MICRONS AT LOW TEMPERATURES

机译：用于测量低温下16至45微米的红外固体光谱发射的仪器

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Aa part of a continuing research project for measuringnhe emittance of solids, a Beckman IR-3 spectrophotometernhas been modified. This modification permits the measurement of spectral emittance of solids in the 16 to 45unregion in the temperature; range between. 77 and 473 K.

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D. L. STIERWALT; D. D. KIRK; J. B. BERNSTEIN;
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年度 1963
页码 1-24
总页数 24
原文格式 PDF
正文语种 eng
中图分类工业技术;
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机译：<！[CDATA [CDATA [HATACES的HOST：SIMPLACE =“POST”> 16 O 16 O 17> 17 o和 16 o 17 O <以下是什么：sup =“post”> 16 o臭氧同位素物种。重新判断的5和10微米谱范围]]>
2. Apparatus to Measure Mid‐Infrared Spectral Emittance of Cold Powers in a Vacuum [J] . Goetz Alexander F. H., Bauman Curtis A. Review of Scientific Instruments . 1967,第6期

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4. Visible/near-infrared hyperspectral sensing of solids under controlled environmental conditions Visible/near-infrared hyperspectral sensing of solids under controlled environmental conditions Visible/near-infrared hyperspectral sensing of solids under controlled environmental conditions [C] . Bruce E. Bernacki Norman C. Anheier Albert Mendoza Bradley G. Fritz and Timothy J. Johnson Conference for chemical, biological, radiological, nuclear, and explosives (CBRNE) sensing . 2011

机译：可见/近红外高光谱检测控制环境条件下的固体可见/近红外高光谱对固体的固体可见/近红外高光谱传感在受控环境条件下固体
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6. Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity [O] . Leonard Hanssen, B. Wilthan, Christian Monte, -1

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7. Development of infrared spectral emissivity measuring system for low temperature [O] . Hideyuki Minato, Yoshinari Ishido 2001

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AN INSTRUMENT FOR MEASURING THE SPECTRAL EMITTANCE OF A SOLID IN THE INFRARED FROM 16 TO 45 MICRONS AT LOW TEMPERATURES

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