TEMPERATURE MEASURING METHOD, TEMPERATURE STRESS MEASURING METHOD, HIGH-TEMPERATURE STRESS TIME MEASURING METHOD, TEMPERATURE MEASURING INSTRUMENT, TEMPERATURE STRESS MEASURING INSTRUMENT, AND HIGH-TEMPERATURE STRESS TIME MEASURING INSTRUMENT

摘要

PROBLEM TO BE SOLVED: To provide a temperature measuring method and temperature measuring instrument and a stress measuring method and stress measuring instrument, that are novel, nondestructive and noncontact type using Raman ray, a temperature stress measuring method and temperature stress measuring instrument capable of measuring a temperature and a stress at once, and a high-temperature time stress measuring method and high-temperature stress time measuring instrument for measurement at high temperatures.;SOLUTION: In the measuring methods and measuring instruments, excitation light is emitted to a Raman-active substance, in particular, a measuring object containing a ceramic to be focused at a prescribed position thereof, and the temperature, the stress and an in-high-temperature stress of the Raman-active substance, in particular, the measuring object containing the ceramic are measured, based on (1) a peak width in a spectrum of the Raman light obtained by the emission of the excitation light, (2) the shift amount of a peak position, (3) peak intensities in a spectrum of the Raman light and/or the fluorescence, (4) the peak width and/or the peak intensity in the spectrum of the Raman light and/or the fluorescence, and the shift level of the peak position, and (5) shifted amount of the peak position in the spectrum of the Raman light and/or the fluorescence.;COPYRIGHT: (C)2006,JPO&NCIPI