X-Ray Topography of Shock Loaded Copper Crystals

摘要

Single crystals of high purity copper subjected to shock loading have been examined by X-ray diffraction topography. The topographs reveal a basic substructure consisting of narrow, close packed kinks normal to highly stressed slip directions and extending rather homogeneously throughout the sample. In the vicinity of fractures, where gross macroscopic deformation occurs, complex interactions are observed. The substructure has been examined as a function of orientation and pressure. (Author)