Ⅰ. ON THE MEANING OF THE FAULT PARAMETERS MEASURED BY X-BAYS Ⅱ. STRAIN DISTRIBUTIONS IN SHOCK-LOADED SINGLE CRYSTALS OF COPPER

摘要

A comparison was ode between the intensity of twin faults seen in the electron microscope and ‘tint effects on the diffraction pattern of a single crystal of copper shock-loaded at 435 kb. The Fourier coefficients of peaks like the (111), (222), (444) and (355) are affected by twin faults and that those of the (333) are not. From this fact the twin fault density can be calculated and compared with the electron microscopic results. Excel! Ant agreement was obtained.nThe strain distributions in shock-loaded copper were shown to be Gaussian.