Analysis of Built-in-Test (BIT) False Alarm Conditions

摘要

Usefulness of BIT is seriously affected by the presence of false alarms. False alarms can degrade mission effectiveness of systems and contribute to the expenditure of excessive maintenance resources. The objectives of this study were to determine the root causes of the false alarm problem and to develop design guidelines to minimize the occurrence and the effect of false alarms. False alarm rates have been established for the three systems investigated and prediction factors defined. (Author)